In this engaging, 11-part micro webinar series, topic experts Graham Naisbitt and Chris Hunt examine the history of the influences of Electrochemical Migration (ECM) and the evolving use of Surface Insulation Resistance Testing (SIR) that has been developed over the past 25 years by GEN3 and its association with the British National Physical Laboratory. GEN3 and NPL have created the standard that has now been in widespread use around the world since the turn of the millennium. The third episode, “ECM Examples,” can be viewed in under five minutes. Presenters share information on ECM types, including examples from Bosch, HP, and NP. Presenters also discuss ECM requirements and more.

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Achieving design for test (DFT) can be challenging for both design and test groups, as sometimes both expect that the other will be the one to manage DFT. The design and test groups might be in the same organization, or they could be an OEM vs. an EMS company. It works best if both the design and test groups are engaged in the process of DFT and trying to achieve the goal of the best test coverage and lowest rate of field returns.

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As humans, we learn facts, gain impressions, create solutions, put practices into place, and move onto our next challenge. Over time, our intent is to create a legacy of value, but in many cases, we are creating legacies in a different sense. Our knowledge, experience, and creations age or become superseded, but there is resistance to replace or update. An increasing gap develops between perception and reality. Younger, more agile peers take advantage, get ahead, and we look away, thinking that they don’t know what they are doing. Though a natural human phenomenon, decision-makers in manufacturing today need to bear this mind more than ever.

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